AI-Driven Customer Churn Prediction in SAP BRIM Environments Using Machine Learning

Prakash Subramani; Arun Prasad Jaganathan

doi:10.1109/UEMCON67449.2025.11267740

AI-Driven Customer Churn Prediction in SAP BRIM Environments Using Machine Learning

Prakash Subramani
, Arun Prasad Jaganathan

Madras University
Jugl Incorporation Limited
Jugl Incorporation Limited Anna University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2025 IEEE 16th Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025
Editors	Rajashree Paul
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	134-142
Number of pages	9
ISBN (Electronic)	9798331565015
DOIs	https://doi.org/10.1109/UEMCON67449.2025.11267740
State	Published - 2025
Externally published	Yes
Event	16th IEEE Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025 - Yorktown Heights, United States Duration: Oct 22 2025 → Oct 24 2025

Publication series

Series	2025 IEEE 16th Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025

Conference

Conference	16th IEEE Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025
Country/Territory	United States
City	Yorktown Heights
Period	10/22/25 → 10/24/25

UN SDGs

This output contributes to the following UN Sustainable Development Goals (SDGs)

SDG 9 Industry, Innovation, and Infrastructure

ASJC Scopus Subject Areas

Artificial Intelligence
Computer Networks and Communications
Computer Science Applications
Computer Vision and Pattern Recognition
Human-Computer Interaction
Instrumentation

Keywords

Churn prediction
Machine Learning
SAP BRIM
Subscription Analytics

Access to Document

10.1109/UEMCON67449.2025.11267740

Cite this

Subramani, P., & Jaganathan, A. P. (2025). AI-Driven Customer Churn Prediction in SAP BRIM Environments Using Machine Learning. In R. Paul (Ed.), 2025 IEEE 16th Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025 (pp. 134-142). Institute of Electrical and Electronics Engineers Inc.. https://doi.org/10.1109/UEMCON67449.2025.11267740

AI-Driven Customer Churn Prediction in SAP BRIM Environments Using Machine Learning. / Subramani, Prakash; Jaganathan, Arun Prasad.
2025 IEEE 16th Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025. ed. / Rajashree Paul. Institute of Electrical and Electronics Engineers Inc., 2025. p. 134-142 (2025 IEEE 16th Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Subramani, P & Jaganathan, AP 2025, AI-Driven Customer Churn Prediction in SAP BRIM Environments Using Machine Learning. in R Paul (ed.), 2025 IEEE 16th Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025. Institute of Electrical and Electronics Engineers Inc., 2025 IEEE 16th Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025, pp. 134-142, 16th IEEE Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025, Yorktown Heights, United States, 10/22/25. https://doi.org/10.1109/UEMCON67449.2025.11267740

Subramani P, Jaganathan AP. AI-Driven Customer Churn Prediction in SAP BRIM Environments Using Machine Learning. In Paul R, editor, 2025 IEEE 16th Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025. Institute of Electrical and Electronics Engineers Inc. 2025. p. 134-142. (2025 IEEE 16th Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025). doi: 10.1109/UEMCON67449.2025.11267740

Subramani, Prakash ; Jaganathan, Arun Prasad. / AI-Driven Customer Churn Prediction in SAP BRIM Environments Using Machine Learning. 2025 IEEE 16th Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025. editor / Rajashree Paul. Institute of Electrical and Electronics Engineers Inc., 2025. pp. 134-142 (2025 IEEE 16th Annual Ubiquitous Computing, Electronics and Mobile Communication Conference, UEMCON 2025).

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AI-Driven Customer Churn Prediction in SAP BRIM Environments Using Machine Learning

Publication series

Conference

UN SDGs

ASJC Scopus Subject Areas

Keywords

Access to Document

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Cite this