Skip to main navigation Skip to search Skip to main content

Diagnosis of Neural Network via Backward Deduction

  • Peifeng Yin
  • , Lei Huang
  • , Sunhwan Lee
  • , Mu Qiao
  • , Shubhi Asthana
  • , Tagiga Nakamura
  • IBM Research - Almaden

Research output: Chapter in Book/Report/Conference proceedingConference contribution

Original languageEnglish
Title of host publicationProceedings - 2019 IEEE International Conference on Big Data, Big Data 2019
EditorsChaitanya Baru, Jun Huan, Latifur Khan, Xiaohua Tony Hu, Ronay Ak, Yuanyuan Tian, Roger Barga, Carlo Zaniolo, Kisung Lee, Yanfang Fanny Ye
PublisherInstitute of Electrical and Electronics Engineers Inc.
Pages260-267
Number of pages8
ISBN (Electronic)9781728108582
DOIs
StatePublished - Dec 2019
Externally publishedYes
Event2019 IEEE International Conference on Big Data, Big Data 2019 - Los Angeles, United States
Duration: Dec 9 2019Dec 12 2019

Publication series

SeriesProceedings - 2019 IEEE International Conference on Big Data, Big Data 2019

Conference

Conference2019 IEEE International Conference on Big Data, Big Data 2019
Country/TerritoryUnited States
CityLos Angeles
Period12/9/1912/12/19

ASJC Scopus Subject Areas

  • Artificial Intelligence
  • Computer Networks and Communications
  • Information Systems
  • Information Systems and Management

Keywords

  • backward deduction
  • deep neural network
  • diagnose
  • interpretation
  • vulnerability detection

Fingerprint

Dive into the research topics of 'Diagnosis of Neural Network via Backward Deduction'. Together they form a unique fingerprint.

Cite this