Effects of impurities and lattice imperfections on the conductive properties of MoS2

Andrew Stroud; Pedro A. Derosa; Gary Leuty; Christopher Muratore; Rajiv Berry; Christopher Muratory

doi:10.1109/NANO.2015.7388679

Effects of impurities and lattice imperfections on the conductive properties of MoS2

Andrew Stroud
, Pedro A. Derosa
, Gary Leuty
, Christopher Muratore
, Rajiv Berry
, Christopher Muratory

Institute for Micromanufacturing
Grambling State University
Sensors Directorate Air Force Research Laboratory Wright Patterson AFB
University of Dayton School of Engineering

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	IEEE-NANO 2015 - 15th International Conference on Nanotechnology
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	613-616
Number of pages	4
ISBN (Electronic)	9781467381550
DOIs	https://doi.org/10.1109/NANO.2015.7388679
State	Published - 2015
Externally published	Yes
Event	15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 - Rome, Italy Duration: Jul 27 2015 → Jul 30 2015

Publication series

Series	IEEE-NANO 2015 - 15th International Conference on Nanotechnology

Conference

Conference	15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015
Country/Territory	Italy
City	Rome
Period	7/27/15 → 7/30/15

ASJC Scopus Subject Areas

Process Chemistry and Technology
Electrical and Electronic Engineering
Ceramics and Composites
Electronic, Optical and Magnetic Materials
Surfaces, Coatings and Films

Keywords

2-D Materials Beyond Graphene
Device
Modeling

Access to Document

10.1109/NANO.2015.7388679

Cite this

Effects of impurities and lattice imperfections on the conductive properties of MoS2. / Stroud, Andrew; Derosa, Pedro A.; Leuty, Gary et al.
IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc., 2015. p. 613-616 7388679 (IEEE-NANO 2015 - 15th International Conference on Nanotechnology).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Stroud, A, Derosa, PA, Leuty, G, Muratore, C, Berry, R & Muratory, C 2015, Effects of impurities and lattice imperfections on the conductive properties of MoS2. in IEEE-NANO 2015 - 15th International Conference on Nanotechnology., 7388679, Institute of Electrical and Electronics Engineers Inc., IEEE-NANO 2015 - 15th International Conference on Nanotechnology, pp. 613-616, 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015, Rome, Italy, 7/27/15. https://doi.org/10.1109/NANO.2015.7388679

Stroud A, Derosa PA, Leuty G, Muratore C, Berry R, Muratory C. Effects of impurities and lattice imperfections on the conductive properties of MoS2. In IEEE-NANO 2015 - 15th International Conference on Nanotechnology. Institute of Electrical and Electronics Engineers Inc. 2015. p. 613-616. 7388679. (IEEE-NANO 2015 - 15th International Conference on Nanotechnology). doi: 10.1109/NANO.2015.7388679

@inproceedings{1bd980c5c32c47b48e77658237a2ef2e,

title = "Effects of impurities and lattice imperfections on the conductive properties of MoS2",

keywords = "2-D Materials Beyond Graphene, Device, Modeling",

author = "Andrew Stroud and Derosa, \{Pedro A.\} and Gary Leuty and Christopher Muratore and Rajiv Berry and Christopher Muratory",

note = "Publisher Copyright: {\textcopyright} 2015 IEEE.; 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015 ; Conference date: 27-07-2015 Through 30-07-2015",

year = "2015",

doi = "10.1109/NANO.2015.7388679",

language = "English",

series = "IEEE-NANO 2015 - 15th International Conference on Nanotechnology",

pages = "613--616",

booktitle = "IEEE-NANO 2015 - 15th International Conference on Nanotechnology",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - GEN

T1 - Effects of impurities and lattice imperfections on the conductive properties of MoS2

AU - Stroud, Andrew

AU - Derosa, Pedro A.

AU - Leuty, Gary

AU - Muratore, Christopher

AU - Berry, Rajiv

AU - Muratory, Christopher

PY - 2015

Y1 - 2015

KW - 2-D Materials Beyond Graphene

KW - Device

KW - Modeling

UR - https://www.scopus.com/pages/publications/84964339329

UR - https://www.scopus.com/pages/publications/84964339329#tab=citedBy

U2 - 10.1109/NANO.2015.7388679

DO - 10.1109/NANO.2015.7388679

M3 - Conference contribution

AN - SCOPUS:84964339329

T3 - IEEE-NANO 2015 - 15th International Conference on Nanotechnology

SP - 613

EP - 616

BT - IEEE-NANO 2015 - 15th International Conference on Nanotechnology

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 15th IEEE International Conference on Nanotechnology, IEEE-NANO 2015

Y2 - 27 July 2015 through 30 July 2015

ER -

Effects of impurities and lattice imperfections on the conductive properties of MoS2

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

Other files and links

Fingerprint

Cite this