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Ellipsometry and x-ray reflectometry characterization of self-assembly process of polystyrenesulfonate and polyallylamine

  • Università di Genova
  • the USSR

Research output: Contribution to journalArticlepeer-review

Original languageEnglish
Pages (from-to)1317-1321
Number of pages5
JournalColloid & Polymer Science
Volume272
Issue number10
DOIs
StatePublished - Oct 1994
Externally publishedYes

ASJC Scopus Subject Areas

  • Physical and Theoretical Chemistry
  • Polymers and Plastics
  • Colloid and Surface Chemistry
  • Materials Chemistry

Keywords

  • ellipsometry
  • optical anisotropy
  • polyelectrolyte
  • self-assembly
  • Thin films

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