Evaluating Side Channel Resilience in iPhone 5c Unlock Scenarios

Fernando Lorenzo; J. Todd McDonald; Todd R. Andel; William B. Glisson; Samuel Russ

doi:10.1109/SoutheastCon42311.2019.9020529

Evaluating Side Channel Resilience in iPhone 5c Unlock Scenarios

Fernando Lorenzo
, J. Todd McDonald
, Todd R. Andel
, William B. Glisson
, Samuel Russ

School of Computing
Sam Houston State University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2019 IEEE SoutheastCon, SoutheastCon 2019
Publisher	Institute of Electrical and Electronics Engineers Inc.
ISBN (Electronic)	9781728101378
DOIs	https://doi.org/10.1109/SoutheastCon42311.2019.9020529
State	Published - Apr 2019
Externally published	Yes
Event	2019 IEEE SoutheastCon, SoutheastCon 2019 - Huntsville, United States Duration: Apr 11 2019 → Apr 14 2019

Publication series

Series	Conference Proceedings - IEEE SOUTHEASTCON
Volume	2019-April
ISSN	1091-0050

Conference

Conference	2019 IEEE SoutheastCon, SoutheastCon 2019
Country/Territory	United States
City	Huntsville
Period	4/11/19 → 4/14/19

ASJC Scopus Subject Areas

Computer Networks and Communications
Software
Electrical and Electronic Engineering
Control and Systems Engineering
Signal Processing

Keywords

fault injection
iOS security
iPhone
side channel vulnerabilities

Access to Document

10.1109/SoutheastCon42311.2019.9020529

Cite this

Evaluating Side Channel Resilience in iPhone 5c Unlock Scenarios. / Lorenzo, Fernando; McDonald, J. Todd; Andel, Todd R. et al.
2019 IEEE SoutheastCon, SoutheastCon 2019. Institute of Electrical and Electronics Engineers Inc., 2019. 9020529 (Conference Proceedings - IEEE SOUTHEASTCON, Vol. 2019-April).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Lorenzo, F, McDonald, JT, Andel, TR, Glisson, WB & Russ, S 2019, Evaluating Side Channel Resilience in iPhone 5c Unlock Scenarios. in 2019 IEEE SoutheastCon, SoutheastCon 2019., 9020529, Institute of Electrical and Electronics Engineers Inc., Conference Proceedings - IEEE SOUTHEASTCON, vol. 2019-April, 2019 IEEE SoutheastCon, SoutheastCon 2019, Huntsville, United States, 4/11/19. https://doi.org/10.1109/SoutheastCon42311.2019.9020529

@inproceedings{a5574ac7da664566a3617e4ea26bd446,

title = "Evaluating Side Channel Resilience in iPhone 5c Unlock Scenarios",

keywords = "fault injection, iOS security, iPhone, side channel vulnerabilities",

author = "Fernando Lorenzo and McDonald, \{J. Todd\} and Andel, \{Todd R.\} and Glisson, \{William B.\} and Samuel Russ",

note = "Publisher Copyright: {\textcopyright} 2019 IEEE.; 2019 IEEE SoutheastCon, SoutheastCon 2019 ; Conference date: 11-04-2019 Through 14-04-2019",

year = "2019",

month = apr,

doi = "10.1109/SoutheastCon42311.2019.9020529",

language = "English",

series = "Conference Proceedings - IEEE SOUTHEASTCON",

booktitle = "2019 IEEE SoutheastCon, SoutheastCon 2019",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - GEN

T1 - Evaluating Side Channel Resilience in iPhone 5c Unlock Scenarios

AU - Lorenzo, Fernando

AU - McDonald, J. Todd

AU - Andel, Todd R.

AU - Glisson, William B.

AU - Russ, Samuel

PY - 2019/4

Y1 - 2019/4

KW - fault injection

KW - iOS security

KW - iPhone

KW - side channel vulnerabilities

UR - https://www.scopus.com/pages/publications/85082391104

UR - https://www.scopus.com/pages/publications/85082391104#tab=citedBy

U2 - 10.1109/SoutheastCon42311.2019.9020529

DO - 10.1109/SoutheastCon42311.2019.9020529

M3 - Conference contribution

AN - SCOPUS:85082391104

T3 - Conference Proceedings - IEEE SOUTHEASTCON

BT - 2019 IEEE SoutheastCon, SoutheastCon 2019

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2019 IEEE SoutheastCon, SoutheastCon 2019

Y2 - 11 April 2019 through 14 April 2019

ER -

Evaluating Side Channel Resilience in iPhone 5c Unlock Scenarios

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

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