Thin sample thickness determination by X-ray flourescence analysis

R. A. Barrea; P. A. Derosa; S. Bengió; R. T. Mainardi

doi:10.1016/S0969-806X(97)00233-8

Thin sample thickness determination by X-ray flourescence analysis

R. A. Barrea
, P. A. Derosa
, S. Bengió
, R. T. Mainardi

Univ. Nac. De Cordoba Cd. Univ.

Research output: Contribution to journal › Article › peer-review

Original language	English
Pages (from-to)	673
Number of pages	1
Journal	Radiation Physics and Chemistry
Volume	51
Issue number	4-6
DOIs	https://doi.org/10.1016/S0969-806X(97)00233-8
State	Published - Jun 1998
Externally published	Yes

ASJC Scopus Subject Areas

Radiation

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title = "Thin sample thickness determination by X-ray flourescence analysis",

author = "Barrea, \{R. A.\} and Derosa, \{P. A.\} and S. Bengi{\'o} and Mainardi, \{R. T.\}",

year = "1998",

month = jun,

doi = "10.1016/S0969-806X(97)00233-8",

language = "English",

volume = "51",

pages = "673",

journal = "Radiation Physics and Chemistry",

issn = "0969-806X",

number = "4-6",

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T1 - Thin sample thickness determination by X-ray flourescence analysis

AU - Barrea, R. A.

AU - Derosa, P. A.

AU - Bengió, S.

AU - Mainardi, R. T.

PY - 1998/6

Y1 - 1998/6

UR - https://www.scopus.com/pages/publications/0032101387

UR - https://www.scopus.com/pages/publications/0032101387#tab=citedBy

U2 - 10.1016/S0969-806X(97)00233-8

DO - 10.1016/S0969-806X(97)00233-8

M3 - Article

AN - SCOPUS:0032101387

SN - 0969-806X

VL - 51

SP - 673

JO - Radiation Physics and Chemistry

JF - Radiation Physics and Chemistry

IS - 4-6

ER -

Thin sample thickness determination by X-ray flourescence analysis

ASJC Scopus Subject Areas

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