Tracking feature relevance with the plaid model in continuously changing datasets

Richard D. Appiah; Sumeet Dua

doi:10.1109/ICKEA.2017.8169895

Tracking feature relevance with the plaid model in continuously changing datasets

Richard D. Appiah
, Sumeet Dua

Louisiana Tech University

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Original language	English
Title of host publication	2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017
Publisher	Institute of Electrical and Electronics Engineers Inc.
Pages	20-24
Number of pages	5
ISBN (Electronic)	9781538621509
DOIs	https://doi.org/10.1109/ICKEA.2017.8169895
State	Published - Dec 7 2017
Externally published	Yes
Event	2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017 - London, United Kingdom Duration: Oct 21 2017 → Oct 23 2017

Publication series

Series	2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017
Volume	2017-January

Conference

Conference	2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017
Country/Territory	United Kingdom
City	London
Period	10/21/17 → 10/23/17

ASJC Scopus Subject Areas

Artificial Intelligence
Computer Networks and Communications
Computer Science Applications
Signal Processing

Keywords

bicluster analysis
biclustering
cluster analysis
feature relevance tracking
feature tracking
plaid model
spatiotemporal data analysis

Access to Document

10.1109/ICKEA.2017.8169895

Cite this

Tracking feature relevance with the plaid model in continuously changing datasets. / Appiah, Richard D.; Dua, Sumeet.
2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017. Institute of Electrical and Electronics Engineers Inc., 2017. p. 20-24 (2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017, Vol. 2017-January).

Research output: Chapter in Book/Report/Conference proceeding › Conference contribution

Appiah, RD & Dua, S 2017, Tracking feature relevance with the plaid model in continuously changing datasets. in 2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017. Institute of Electrical and Electronics Engineers Inc., 2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017, vol. 2017-January, pp. 20-24, 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017, London, United Kingdom, 10/21/17. https://doi.org/10.1109/ICKEA.2017.8169895

Appiah RD, Dua S. Tracking feature relevance with the plaid model in continuously changing datasets. In 2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017. Institute of Electrical and Electronics Engineers Inc. 2017. p. 20-24. (2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017, Vol. 2017-January). doi: 10.1109/ICKEA.2017.8169895

Appiah, Richard D. ; Dua, Sumeet. / Tracking feature relevance with the plaid model in continuously changing datasets. 2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017. Institute of Electrical and Electronics Engineers Inc., 2017. pp. 20-24 (2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017, Vol. 2017-January).

@inproceedings{48eeb5ed64954d9f9e968fd018bb60c6,

title = "Tracking feature relevance with the plaid model in continuously changing datasets",

keywords = "bicluster analysis, biclustering, cluster analysis, feature relevance tracking, feature tracking, plaid model, spatiotemporal data analysis",

author = "Appiah, \{Richard D.\} and Sumeet Dua",

note = "Publisher Copyright: {\textcopyright} 2017 IEEE.; 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017 ; Conference date: 21-10-2017 Through 23-10-2017",

year = "2017",

month = dec,

day = "7",

doi = "10.1109/ICKEA.2017.8169895",

language = "English",

series = "2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017",

pages = "20--24",

booktitle = "2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017",

publisher = "Institute of Electrical and Electronics Engineers Inc.",

}

TY - GEN

T1 - Tracking feature relevance with the plaid model in continuously changing datasets

AU - Appiah, Richard D.

AU - Dua, Sumeet

PY - 2017/12/7

Y1 - 2017/12/7

KW - bicluster analysis

KW - biclustering

KW - cluster analysis

KW - feature relevance tracking

KW - feature tracking

KW - plaid model

KW - spatiotemporal data analysis

UR - https://www.scopus.com/pages/publications/85046455155

UR - https://www.scopus.com/pages/publications/85046455155#tab=citedBy

U2 - 10.1109/ICKEA.2017.8169895

DO - 10.1109/ICKEA.2017.8169895

M3 - Conference contribution

AN - SCOPUS:85046455155

T3 - 2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017

SP - 20

EP - 24

BT - 2017 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017

PB - Institute of Electrical and Electronics Engineers Inc.

T2 - 2nd International Conference on Knowledge Engineering and Applications, ICKEA 2017

Y2 - 21 October 2017 through 23 October 2017

ER -

Tracking feature relevance with the plaid model in continuously changing datasets

Publication series

Conference

ASJC Scopus Subject Areas

Keywords

Access to Document

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